Researcher Director at CERTH-ITI, the Head of Multimedia Knowledge and Social Media Analytics Laboratory and Deputy Director of the Institute
- Title of the talk:
Visual Information Analysis for Crisis and Natural Disasters Management and Response
Crises and natural disasters are unwelcome, but also unavoidable features of modern society, affecting more communities than ever. Visual information analysis plays an important role in efficient pre-event (e.g. risk modeling), during the event (response) and post-event (recovery) emergency situation management. This talk will describe the potential role of visual information sources including satellite images, surveillance and traffic cameras, social multimedia and aerial video in applications such as floods, fires, and oil spills. Multimodal and fusion techniques will be presented combining satellite and social data and how deep neural networks can be applied in this domain. The talks will include demos and results from the relevant BeAware and EOPEN projects and from our participation in the 2018 Multimedia Satellite Task of the MediaEval Benchmarking Initiative.
- Short biography:
Dr. Ioannis (Yiannis) Kompatsiaris is a Researcher Director at CERTH-ITI, the Head of Multimedia Knowledge and Social Media Analytics Laboratory and Deputy Director of the Institute. His research interests include multimedia, big data and social media analytics, semantics, human computer interfaces (AR and BCI), eHealth, security and culture applications. He is the co-author of 129 papers in refereed journals, 46 book chapters, 8 patents and more than 420 papers in international conferences. Since 2001, Dr. Kompatsiaris has participated in 59 National and European research programs including direct collaboration with industry, in 15 of which he has been the Project Coordinator and in 41 the Principal Investigator. He has been the co-organizer of various international conferences and workshops and has served as a regular reviewer, associate and guest editor for a number of journals and conferences. He is a Senior Member of IEEE and member of ACM.